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Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System Installed PCB'S
Part No: P500/018
028-005336-1 FITTING
SDP/EBI BOARD
FEI Company 150-002730 Test and Diagnostics PCB Card CLM-3D Used Working Removed from a JEOL JWS-2000FEI Company 150 002730 Test and Diagnostics PCB Card CLM 3D Used Working Inventory # 15208 This FEI Company 150 002730 is used working surplus. The physical condition is good, but there are signs of previous use and handling. Removed from a FEI Company CLM 3D 200mm CLM DualBeam Metrology System. Specifications Part No: 150 002730 Model No: Test & Diagnostics PCB Rev. X6 140 002730 Removed from a FEI Company CLM 3D 200mm CLM DualBeam Metrology System
US$ 62.00
US$ 50.00
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