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FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System
139 VITON 75 DURO BRN
Estimated Packed Shipping Dimensions: L x W x H = 25"x25"x20" @ 110 lbs
Model No: F352085-1
JEOL AP002210(00) Processor PCB Card FE CANSEL PB JSM-6300F SEM Working Surplus FEI Company XL 830 DualBeamJEOL AP002210(00) Processor PCB Card FE CANSEL PB JSM 6300F SEM Working Surplus Inventory # CONO 380,21156 Part No: AP002210(00) Model No: FE CANSEL PB Removed from a JEOL JSM 6300F SEM Scanning Electron Microscope System This JEOL AP002210(00) Processor PCB Card FE CANSEL PB is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated
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