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JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare Part No: CT1386-456646-12

SKU: 49291156432
4.8
USD755.60 USD802.60

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Ships within 48 hours · Estimated delivery Aug 24 - Aug 29

Description

Part No: CT1386-456646-12

94765 Processor PCB Card is used working surplus

The unit was powered on in our test facility but could not be fully tested as we currently do not have all of the required components

Inventory # 18357

JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare Part No: CT1386-456646-12JEOL Electron Detector Assembly JWS 7555S Wafer Defect Review SEM Working Spare Inventory # CONF 1330 Part No: Detector Assembly Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Electron Detector Assembly JWS 7555S Wafer Defect Review SEM is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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