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Pulse Laser Diode Test System with optional Integrating Sphere 2520/KIT1: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test
Output: 12VDC
Arbitrary waveforms of up to 128K points at up to 125MS/s
Attenuation: 25X / 250X
Hioki RM3544-01 Resistance HiTester data logger Pulse Laser Diode Test SystemWide Range 30 m to 3 M DC Resistance Meters with Temperature Correction for High Speed Testing on Production Lines Built in EXT I O, RS 232C, USB
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