JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} HX Series Neslab HX-75

img{max-width:100%} HX Series Neslab HX-75 Recirculating Chiller Tested Working Spare

Inventory # A-10185

UR10-0064257 This item is new surplus

Removed from a FEI Company XL 30 Field Emission ESEM Scanning Electron Microscope System This FEI Company 4022 192 71121 PCB Card is used working surplus

JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} HX Series Neslab HX-75JEOL Inspection Stage Chamber Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1322 Part No: Inspection Stage Chamber Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System Installed Components Copal Electronics Part No: PS83 102V Keyence Part No: FS V31 Koganei Part No: JDAS12x5 74W Omron Part No: E3X A11 Oriental Motor Part No: PX535MH B, VEXTA SMC Part No: CDRQB20 01 476 This JEOL